MEEM - Metrology for Energy and Electronic Materials
This research project aims at developing advanced metrology methods for thermoelectric characterization of semiconductors. The project will focus on bringing solutions to two of society’s important challenges within material science, i.e. (1) engineering materials to efficiently convert waste heat energy into electricity and (2) how to make more energy efficient electronics. Micro-electrodes are already today used in fully automated metrology tools for electrical characterization of semiconductor materials. This project will greatly advance state-of-the-art technology to allow for thermoelectric characterization, providing fast and accurate measurements of the key performance indicators for three-dimensional thermoelectric materials (the ‘figure of merit’) and for one-dimensional electronic materials (the charge carrier concentration and mobility in nanostructures).