XPS is a powerful technique for determining which elements are present in a given sample, and the oxidation states of the present elements. Thus by applying XPS detailed knowledge on a materials composition and the bonding states of the present elements may be obtained. The standard probe-depth of XPS is <10 nm, however by ion-sputtering depth-profiles through a sample may be obtained. Furthermore, angle-resolved measurements may yield insight into possible stratification in the outermost layers of the samples. In addition, the XPS at DTU Energy offers advanced opportunities for spectroscopic imaging, Ion Scattering Spectroscopy (ISS) and Reflection Electron Energy Loss Spectroscopy (REELS).
Model Number: ESCALAB 250 Xi XPS
Time in service: Since 2015