Dirch Hjorth Petersen - Section for Functional Oxides

Deconvolution of heat sources for application in thermoelectric micro four-point probe measurements

Lamba, Neetu ; Guralnik, Benny ; Beltrán-Pitarch, Braulio ; Rosendal, Victor ; Pryds, Nini ; Hansen, Ole ; Petersen, Dirch Hjorth
in: International Journal of Thermal Sciences, vol: 196

Type: Journal article (Peer reviewed)

Status: Published | Year: 2024 | DOI: https://doi.org/10.1016/j.ijthermalsci.2023.108716

Temperature coefficient of resistance and thermal boundary conductance determination of ruthenium thin films by micro four-point probe

Beltrán-Pitarch, Braulio ; Guralnik, Benny ; Borup, Kasper A ; Adelmann, Christoph ; Hansen, Ole ; Pryds, Nini ; Petersen, Dirch H
in: Measurement Science and Technology, vol: 35, issue: 6

Type: Journal article (Peer reviewed)

Status: Published | Year: 2024 | DOI: https://doi.org/10.1088/1361-6501/ad366b

Determination of thermal diffusivity of thermoelectric materials using a micro four-point probe method

Beltrán-Pitarch, Braulio ; Guralnik, Benny ; Lamba, Neetu ; Stilling-Andersen, Andreas R. ; Nørregaard, Lars ; Hansen, Torben M. ; Hansen, Ole ; Pryds, Nini ; Nielsen, Peter F. ; Petersen, Dirch H.
in: Materials Today Physics, vol: 31

Type: Journal article (Peer reviewed)

Status: Published | Year: 2023 | DOI: https://doi.org/10.1016/j.mtphys.2022.100963

Octahedral distortions in SrNbO₃

Rosendal, Victor ; Brito, Walber H. ; Radovic, Milan ; Chikina, Alla ; Brandbyge, Mads ; Pryds, Nini ; Petersen, Dirch H.
in: Physical Review Materials, vol: 7, issue: 7

Type: Journal article (Peer reviewed)

Status: Published | Year: 2023 | DOI: https://doi.org/10.1103/PhysRevMaterials.7.075002

Determination of thermoelectric properties from micro four-point probe measurements

Guralnik, Benny ; Hansen, Ole ; Stilling-Andersen, Andreas R ; Hansen, Søren E ; Borup, Kasper A ; Mihiretie, Besira M ; Beltrán-Pitarch, Braulio ; Henrichsen, Henrik H ; Lin, Rong ; Shiv, Lior ; Iversen, Bo B ; Nielsen, Peter F ; Petersen, Dirch H
in: Measurement Science and Technology, vol: 33, issue: 12

Type: Journal article (Peer reviewed)

Status: Published | Year: 2022 | DOI: https://doi.org/10.1088/1361-6501/ac88ea

Review of Micro- and Nanoprobe Metrology for Direct Electrical Measurements on Product Wafers

Guralnik, Benny ; Nielsen, Peter F. ; Petersen, Dirch H. ; Hansen, Ole ; Shiv, Lior ; Wei, Wilson ; Marangoni, Thomas A. ; Buron, Jonas D. ; Osterberg, Frederik W. ; Lin, Rong ; Henrichsen, Henrik H. ; Hansen, Mikkel F.
part of: Proceedings of 2022 China Semiconductor Technology International Conference (CSTIC), 2022
Presented at: 2022 China Semiconductor Technology International Conference

Type: Conference abstract in proceedings (Peer reviewed)

Status: Published | Year: 2022 | DOI: https://doi.org/10.1109/CSTIC55103.2022.9856824

3ω correction method for eliminating resistance measurement error due to Joule heating

Guralnik, Benny ; Hansen, Ole ; Henrichsen, Henrik H. ; Beltrán-Pitarch, Braulio ; Østerberg, Frederik W. ; Shiv, Lior ; Marangoni, Thomas A. ; Stilling-Andersen, Andreas R. ; Cagliani, Alberto ; Hansen, Mikkel F. ; Nielsen, Peter F. ; Oprins, Herman ; Vermeersch, Bjorn ; Adelmann, Christoph ; Dutta, Shibesh ; Borup, Kasper A. ; Mihiretie, Besira M. ; Petersen, Dirch H
in: Review of Scientific Instruments, vol: 92, issue: 9

Type: Journal article (Peer reviewed)

Status: Published | Year: 2021 | DOI: https://doi.org/10.1063/5.0063998

Apparent size effects on dopant activation in nanometer-wide Si fins

Folkersma, Steven ; Bogdanowicz, Janusz ; Favia, Paola ; Wouters, Lennaert ; Petersen, Dirch Hjorth ; Hansen, Ole ; Henrichsen, Henrik Hartmann ; Nielsen, Peter Former ; Shiv, Lior ; Vandervorst, Wilfried
in: Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures, vol: 39, issue: 2

Type: Journal article (Peer reviewed)

Status: Published | Year: 2021 | DOI: https://doi.org/10.1116/6.0000921

Case studies of electrical characterisation of graphene by terahertz time-domain spectroscopy

Whelan, Patrick R. ; Zhou, Binbin ; Bezencenet, Odile ; Shivayogimath, Abhay ; Mishra, Neeraj ; Shen, Qian ; Jessen, Bjarke S. ; Pasternak, Iwona ; Mackenzie, David M.A. ; Ji, Jie ; Sun, Cunzhi ; Seneor, Pierre ; Dlubak, Bruno ; Luo, Birong ; Østerberg, Frederik W. ; Huang, Deping ; Shi, Haofei ; Luo, Da ; Wang, Meihui ; Ruoff, Rodney S. ; Conran, Ben R. ; McAleese, Clifford ; Huyghebaert, Cedric ; Brems, Steven ; Booth, Tim ; Napal, Ilargi ; Strupinski, Wlodek ; Petersen, Dirch Hjorth ; Forti, Stiven ; Coletti, Camilla ; Jouvray, Alexandre ; Teo, Kenneth B.K. ; Centeno, Alba ; Zurutuza, Amaia ; Legagneux, Pierre ; Jepsen, Peter Uhd ; Bøggild, Peter
in: 2D materials, vol: 8, issue: 2

Type: Review (Peer reviewed)

Status: Published | Year: 2021 | DOI: https://doi.org/10.1088/2053-1583/abdbcb