Gan, Y. L. ; von Soosten, M. ; Zhang, Y. ; Krishnan, D. ; Zhong, Z. ; Niu, W. ; Carrad, D. J. ; Norrman, K. ; Christensen, D. V. ; Gauquelin, N. ; Jespersen, T. S. ; Shen, B.G. ; Verbeeck, J. ; Sun, J. R. ; Pryds, N. ; Chen, Y. Z.
Presented at:
25th International Workshop on Oxide Electronics
Type: Conference abstract for conference (Peer reviewed)
Status:
Published
| Year:
2018